Defect analysis of HfO2/In0.53Ga0.47As interface using capacitance-voltage and conductance methods - I-Scover metadata
ARTICLE

Defect analysis of HfO2/In0.53Ga0.47As interface using capacitance-voltage and conductance methods

Metadata details

now loading...

Related ARTICLE(s)

now loading...

Related metadata

now loading...

Search by external websites

now loading...

Login 日本語