Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta2O5 gate stacks - I-Scover metadata
ARTICLE

Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta2O5 gate stacks

Metadata details

now loading...

Related ARTICLE(s)

now loading...

Related metadata

now loading...

Search by external websites

now loading...

Login 日本語